Get a deeper knowledge and understanding of advanced microscopy for steel in your daily work.

Learn about the latest innovations in our GeminiSEM field emission portfolio, including advanced imaging and in situ techniques, imaging sweet spots and analytical accessories.

We will explain how the Crossbeam focused Ion Beam SEM from ZEISS is able to rapidly access and provide high quality 3D nano-scale data to inform your research.

See how our portfolio of X-ray microscopy solutions provide high resolution 3D tomography and crystallography and combine multiple 2D and 3D datasets with novel solutions for correlation and connection of multiple datasets to truly understand your materials in multiple modes and length scales.

The webinar will take place in GoToWebinar and one day prior to the webinar you will receive an access link to join the meeting.

Register here.